Articles citing this article

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The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Zerstörungsfreie Messung dünner Schichten mit polarisationsoptischen Methoden

D. Stifter, A. Bonanni, K. Hingerl and H. Sitter
e & i Elektrotechnik und Informationstechnik 116 (5) 315 (1999)

Influence of free carrier concentration on absorption and third-order susceptibilities of n-type ZnSe crystals

B. Sahraoui, R. Chevalier, X. Nguyen Phu, G. Rivoire and W. Bala
Journal of Applied Physics 80 (9) 4854 (1996)