Near-Field Acoustic Microscopy
Europhys. News, 27 3 (1996) 93-96
Published online: 2017-07-12
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Surface acoustic wave-assisted scanning probe microscopy—a summary
Thorsten HesjedalReports on Progress in Physics 73 (1) 016102 (2010)
https://doi.org/10.1088/0034-4885/73/1/016102
Applied Scanning Probe Methods II
Ute RabeNanoScience and Technology, Applied Scanning Probe Methods II 37 (2006)
https://doi.org/10.1007/3-540-27453-7_2
Nonlinear detection of ultrasonic vibration of AFM cantilevers in and out of contact with the sample
M T Cuberes, G A D Briggs and O KolosovNanotechnology 12 (1) 53 (2001)
https://doi.org/10.1088/0957-4484/12/1/310
Heterodyne force microscopy of PMMA/rubber nanocomposites: nanomapping of viscoelastic response at ultrasonic frequencies
M T Cuberes, H E Assender, G A D Briggs and O V KolosovJournal of Physics D: Applied Physics 33 (19) 2347 (2000)
https://doi.org/10.1088/0022-3727/33/19/301
High-frequency response of atomic-force microscope cantilevers
Joseph A. Turner, Sigrun Hirsekorn, Ute Rabe and Walter ArnoldJournal of Applied Physics 82 (3) 966 (1997)
https://doi.org/10.1063/1.365935
Tip-sample interactions in scanning force microscopy using the frequency-modulation technique: Experiments and computer simulation
B Gotsmann, D Krüger and H FuchsEurophysics Letters (EPL) 39 (2) 153 (1997)
https://doi.org/10.1209/epl/i1997-00542-5
Theoretical description of the transfer of vibrations from a sample to the cantilever of an atomic force microscope
S Hirsekorn, U Rabe and W ArnoldNanotechnology 8 (2) 57 (1997)
https://doi.org/10.1088/0957-4484/8/2/003
Nanomechanical surface characterization by atomic force acoustic microscopy
U. Rabe, V. Scherer, S. Hirsekorn and W. ArnoldJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 15 (4) 1506 (1997)
https://doi.org/10.1116/1.589484