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Cited article:

BREAKDOWN MODES AND BREAKDOWN STATISTICS OF ULTRATHIN SiO2 GATE OXIDES

JORDI SUÑE, DAVID JIMENEZ and ENRIQUE MIRANDA
International Journal of High Speed Electronics and Systems 11 (03) 789 (2001)
https://doi.org/10.1142/S0129156401001003

Nanometer thin-film Ni–NiO–Ni diodes for detection and mixing of 30 THz radiation

C. Fumeaux, W. Herrmann, F.K. Kneubühl and H. Rothuizen
Infrared Physics & Technology 39 (3) 123 (1998)
https://doi.org/10.1016/S1350-4495(98)00004-8

Nanometer thin-film Ni-NiO-Ni diodes for 30 THz radiation

I. Wilke, Y. Oppliger, W. Herrmann and F. K. Kneub�hl
Applied Physics A Solids and Surfaces 58 (4) 329 (1994)
https://doi.org/10.1007/BF00323606